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Boundary scan
Results: 183

#	Item
161	JTAG Boundary-Scan Testing in Cyclone V Devices Add to Reading List Source URL: www.altera.com Language: English - Date: 2014-07-01 04:08:33 Electronic engineering IEEE standards Embedded systems Joint Test Action Group Microcontrollers Boundary scan Electronics manufacturing Manufacturing Electronics
162	INTERFACE DESIGN DOCUMENT Add to Reading List Source URL: www.ospo.noaa.gov Language: English - Date: 2012-07-28 08:24:11 Electronics manufacturing Boundary scan
163	Chapter 5: Design for Testability Cheng-Wen Wu 吳誠文 Lab for Reliable Computing Dept. Electrical Engineering National Tsing Hua University Add to Reading List Source URL: larc.ee.nthu.edu.tw Language: English - Date: 2006-03-22 19:48:37 Electronics Electronics manufacturing Electronic design Design for X Design for testing Scan chain Joint Test Action Group Boundary scan National Tsing Hua University Electronic engineering Design Electronic design automation
164	Design File Lori Shepherd and Jonathan Dare July 10, 2007 Contents Every sample must have a design specified in the inventory. This design Add to Reading List Source URL: sphhp.buffalo.edu Language: English - Date: 2014-07-18 07:37:51 Electronics Electronics manufacturing Electronic design Technology Computer memory Microcontrollers Boundary scan Grid plan Road transport Electronic engineering
165	Cyclone III Device Handbook Volume 1. Chapter 12. IEEE[removed]JTAG) Boundary-Scan Testing for Cyclone III Devices Add to Reading List Source URL: www.altera.com Language: English - Date: 2014-04-23 01:52:16 Electronic engineering IEEE standards Embedded systems Joint Test Action Group Altera Boundary scan description language Boundary scan Electronics manufacturing Manufacturing Electronics
166	Breakthrough silicon scanning discovers backdoor in military chip (DRAFT of 05 March[removed]Sergei Skorobogatov Christopher Woods Add to Reading List Source URL: deeprecursion.com Language: English - Date: 2014-05-15 05:47:01 Electronics manufacturing Manufacturing IEEE standards Microcontrollers Joint Test Action Group Power analysis Boundary scan Field-programmable gate array TI MSP430 Electronics Electronic engineering Embedded systems
167	IEEE[removed]Silicon Instruments with IEEE 1500 supported by Intellitech testers Add to Reading List Source URL: www.intellitech.com Language: English - Date: 2013-06-17 09:45:55 IEEE standards Electronic engineering Embedded systems Joint Test Action Group Boundary scan description language Intellitech Boundary scan IEEE Standards Association Field-programmable gate array Electronics manufacturing Manufacturing Electronics
168	SIB, P1687, 1687, instruments compared to[removed] Add to Reading List Source URL: www.intellitech.com Language: English - Date: 2013-09-16 17:02:08 Electronics Technology Electronic engineering Joint Test Action Group Boundary scan Institute of Electrical and Electronics Engineers Intellitech IEEE Standards Association Electronics manufacturing IEEE standards Standards organizations
169	An Ecomonical Alternative to Boundary Scan in Memory Devices Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-01-22 18:19:36 Manufacturing Boundary scan Design for testing Joint Test Action Group In-circuit test Automatic test pattern generation Integrated circuit design Input/output Reliability engineering Electronics manufacturing Electronic engineering Electronics
170	This Poster provides an overview of IEEE Std[removed]test mode entry and exit methods as well as examples for test logic implementations. IEEE Std 1581 drastically simplifies connectivity test for memory devices poten Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2011-09-27 22:35:01 Electronics manufacturing Embedded systems Digital electronics Logic gate Boundary scan XNOR gate Microcontroller Joint Test Action Group Electronic engineering Electronics Manufacturing

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